TODAES Rookie Award -- DAC 2025

Davide Baroffio has been honoured with the TODAES Rookie Author of the Year (RAY) Award during the prestigious DAC 2025 Conference, held on June 25 in San Francisco.
His award-winning paper, titled “Enhanced Compiler Technology for Software-Based Hardware Fault Detection” and co-authored with Federico Reghenzani and Prof. William Fornaciari, was published in the ACM Transactions on Design Automation of Embedded Systems.
The research focuses on improving the reliability of electronic systems using a software-only approach. In simple terms, the team developed smarter tools that allows computing platforms to tolerate hardware problems without needing to employ custom components. Their solution builds on a tool called ASPIS, adding new safety features while also reducing the impact on system performance.
The study also tested the tool on FreeRTOS, a widely-used real-time operating system, and ran fault-injection experiments on a popular STM32 microcontroller board. The results showed that the system could handle faults effectively, striking a balance between safety and efficiency.
This work is part of the HEAP Lab’s ongoing research within the National Centre for HPC, Big Data, and Quantum Computing, funded by Italy’s PNRR (National Recovery and Resilience Plan).